• On-Line Sort Pattern Inquiry determines item validity, pocketing, endpoint, document type and edit rules. It allows instant verification of sort pattern changes without test decks or sorter capture!
• On-Line screens are easy to use; just enter the sort pattern and MICR documents you wish to test and press <enter> or PF2. The results are displayed instantly on the screen.
• Batch Mode feature teams up SPIS with CONIX Systems' On-Line Test Aid (TAID™) or MICR Extract Utility™ (MUTIL^®) product to provide volume testing of sort pattern changes. Test thousands of items automatically! SPIS reports any differences in MICR fields, pocket, record ID or validity flags, etc. You can even create output CPCS strings from input files to test other CPCS applications. This feature has tested literally millions of items in CPCS conversions around the United States.
• Programmer Debug facility displays and searches MUPA work area, re-entrant work space, MRD Buffer, etc. It enables quicker resolution of problems.
• SPIS is compatible with most sort pattern systems, including most custom or proprietary systems (not all information is available with all sort pattern systems).

For more information on SPIS, fill out the contact sheet below, then press the Submit button.